Characterization of Materials

Optical microscopy, interference contrast, quantitative analysis. SEM and TEM principles and configuration, elastic and inelastic scattering, SE, BSE, imaging, WDS and EDS microanalysis, BSCP, TEM BF and DF contrast, diffraction patterns, STEM. Defect analysis, sample preparation, EPMA, field ion microscopy (AP-FIM) and concentration profiling. Scanning tunnelling, acoustic and atomic force microscopy, DTA, DSC and dilatometry, AES and SIMS, molecular spectroscopy.

Hours: XYZ where X = Lecture, Y = Lab, Z = Credit
All hours are per week.
3 Lab hours constitute 1 credit hour
1 credit hour implies 1 lecture of 50mins per academic week. 16 weeks in total.
Pre-Requisite courses are courses required to be completed before this course may be taken
Co-Requisite courses are courses required to be taken along with this course